Two different pattern recognition procedures were applied
A. Single chip form classification
B. Favourable/unfavourable chip form identification
NN training and testing was carried out using the leave-k-out method (k = 1)
|
CHIP FORM |
CODED VALUE |
TRAINING CASES |
|
Snarled |
0 |
45 |
|
Long |
1 |
20 |
|
Loose |
2 |
65 |
|
Short |
3 |
10 |
|
Favourable |
0 |
75 |
|
Unfavourable |
1 |
65 |