Two different pattern recognition procedures were applied
A. Single chip form classification
B. Favourable/unfavourable chip form identification
NN training and testing was carried out using the leave-k-out method (k = 1)
CHIP FORM
CODED VALUE
TRAINING CASES
Snarled
0
45
Long
1
20
Loose
2
65
Short
3
10
Favourable(Loose/Short)
75
Unfavourable(Snarled/Long)